SILVER DIFFUSION AND PATTERN-FORMATION ON POLYCRYSTALLINE TIN OXIDE-FILMS

被引：20
|
作者：
ZHANG, JP
COLBOW, K
机构：
[1] Physics Department, Simon Fraser University, Burnaby
来源：
JOURNAL OF APPLIED PHYSICS | 1992年 / 71卷 / 05期
关键词：
D O I：
10.1063/1.351121
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We report on some quantitative observations of silver diffusion and pattern growth on thin tin oxide film under different operating conditions. The patterns obtained from our experimental method have both fractal and dense packed structures. The fractal dimension of self-similar cluster in two dimensions is found to be 1.68 +/- 0.05 which is in good agreement with the theoretical value of 1.70 predicted by diffusion limited aggregation cluster growth. In addition, the scanning electron microscope picture and x-ray diffraction measurements give insight into this new type of aggregate.
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页码：2238 / 2242
页数：5
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