DETECTION OF SINGLE INTERMITTENT FAULTS IN SEQUENTIAL-CIRCUITS

被引：0

作者：

SAVIR, J ^{[1
]}

机构：

[1] STANFORD UNIV,CTR RELIABLE COMP,DEPT ELECT ENGN & COMP SCI,DIGITAL SYST LAB,STANFORD,CA 94305

来源：

IEEE TRANSACTIONS ON COMPUTERS | 1980年 / 29卷 / 07期

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：673 / 678

页数：6

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