SHORT SAMPLE TESTS OF FULL-SCALE SUPERCONDUCTING CONDUCTORS FOR LARGE HELICAL DEVICE

被引:16
|
作者
MITO, T
TAKAHATA, K
YANAGI, N
YAMADA, S
NISHIMURA, A
SAKAMOTO, M
YAMAMOTO, J
机构
[1] National Institute for Fusion Science (NIFS), Chikusa-ku, Nagoya-shi, 464–01, Furo-cho
关键词
4;
D O I
10.1109/20.119848
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have been developing superconducting conductors for the helical coils of the Large Helical Device (LHD). From the test results of scale-down R&D conductors, one conductor, KISO-4B, was selected for its simple structure and good stability. Other conductor named Design-M have been manufactured in its actual scale from the first. These two types of conductors were selected and go forward to the full-scale tests. Since both conductors have multi-layered strand cables without the transposition, it is feared that the uneven current distribution between strands may cause the degradation of the critical current. A new method of measuring the current distribution inside the conductor was introduced. A pick up coil wound on the conductor detects the magnetic flux change in the conductor longitudinal direction and becomes a sensor to measure the current distribution. Using the test facility for full-scale conductors, the Design-M conductor has been tested about the critical current and stability. From the test results of Design-M, the uneven current distribution from the outer layer strands to the inner layer strands inside the conductor was observed. However, no degradation of the critical current was measured.
引用
收藏
页码:214 / 217
页数:4
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