EXAMINATION OF THIN-FILMS OF LOW-PRESSURE DIAMOND BY TRANSMISSION ELECTRON-MICROSCOPY

被引：2
|
作者：
CHATFIELD, C [1 ]
HAUBNER, R [1 ]
LUX, B [1 ]
机构：
[1] TECH UNIV VIENNA,INST CHEM TECHNOL INORGAN MAT,A-1060 VIENNA,AUSTRIA
来源：
JOURNAL OF MATERIALS SCIENCE LETTERS | 1989年 / 8卷 / 10期
关键词：
D O I：
10.1007/BF01730066
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：1188 / 1192
页数：5
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