A HISTORY OF X-RAY ABSORPTION FINE-STRUCTURE

被引:38
|
作者
VONBORDWEHR, RS
机构
关键词
D O I
10.1051/anphys:01989001404037700
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:377 / 466
页数:90
相关论文
共 50 条
  • [22] X-RAY ABSORPTION NEAR-EDGE STRUCTURE AND EXTENDED X-RAY ABSORPTION FINE-STRUCTURE INVESTIGATION OF PD SILICIDES
    DECRESCENZI, M
    COLAVITA, E
    DELPENNINO, U
    SASSAROLI, P
    VALERI, S
    RINALDI, C
    SORBA, L
    NANNARONE, S
    PHYSICAL REVIEW B, 1985, 32 (02): : 612 - 622
  • [23] EXTENDED X-RAY ABSORPTION FINE-STRUCTURE (EXAFS) STUDIES OF LANTHANIDES
    VIJAYAVARGIYA, VP
    GUPTA, SN
    PADALIA, BD
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1977, 80 (01): : 83 - 88
  • [24] TUNABLE LABORATORY EXTENDED X-RAY ABSORPTION FINE-STRUCTURE SYSTEM
    COHEN, GG
    FISCHER, DA
    COLBERT, J
    SHEVCHIK, NJ
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1980, 51 (03): : 273 - 277
  • [25] FINE-STRUCTURE OF X-RAY K-ABSORPTION EDGE OF FE
    SRIVASTAVA, KS
    SHRIVASTAVA, RL
    SINGH, SP
    INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1976, 14 (02) : 140 - 141
  • [26] A DISPERSIVE METHOD OF MEASURING EXTENDED X-RAY ABSORPTION FINE-STRUCTURE
    KAMINAGA, U
    MATSUSHITA, T
    KOHRA, K
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1981, 20 (05) : L355 - L358
  • [27] CRITERIA FOR AUTOMATIC X-RAY ABSORPTION FINE-STRUCTURE BACKGROUND REMOVAL
    COOK, JW
    SAYERS, DE
    JOURNAL OF APPLIED PHYSICS, 1981, 52 (08) : 5024 - 5031
  • [28] THEORY OF EXTENDED FINE-STRUCTURE OF X-RAY ABSORPTION-SPECTRA
    KEILACKER, H
    MEISEL, A
    ANNALEN DER PHYSIK, 1974, 31 (03) : 239 - 246
  • [29] EXTENDED X-RAY ABSORPTION FINE-STRUCTURE INVESTIGATIONS OF NICKEL HYDROXIDES
    PANDYA, KI
    OGRADY, WE
    CORRIGAN, DA
    MCBREEN, J
    HOFFMAN, RW
    JOURNAL OF PHYSICAL CHEMISTRY, 1990, 94 (01): : 21 - 26
  • [30] EXTENDED X-RAY ABSORPTION FINE-STRUCTURE AND VIBRATIONAL DYNAMICS IN AGI
    DALBA, G
    FORNASINI, P
    MOBILIO, S
    ROCCA, F
    PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1989, 59 (01): : 143 - 149