AUTOMATIC DIGITAL DEVICE FOR MEASURING ELECTROPHYSICAL CHARACTERISTICS OF SEMICONDUCTORS

被引：0
|
作者：
LIFSHITS, TM
OLEINIKOV, AY
ROMANOVTSEV, VV
机构：
来源：
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR | 1970年 / 02期
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中图分类号：
T [工业技术];
学科分类号：
08 ;
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页码：581 / +
页数：1
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