DEVELOPMENT OF AN ULTRA HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPE BY MEANS OF A FIELD-EMISSION SOURCE AND IN-LENS SYSTEM

被引：0
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作者：
NAGATANI, T
SAITO, S
SATO, M
YAMADA, M
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来源：
SCANNING MICROSCOPY | 1987年 / 1卷 / 03期
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TH742 [显微镜];
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页码：901 / 909
页数：9
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