THE EFFECT OF ANNEALING TEMPERATURE ON HOT-CARRIER HARDNESS, AND ACCELERATION TESTING FOR HOT-CARRIER-INDUCED DEGRADATION

被引：0
|
作者：
SHIMAYA, M
SHIMOYAMA, N
SHIONO, N
机构：
来源：
DENKI KAGAKU | 1990年 / 58卷 / 07期
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D O I：
暂无
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
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页码：638 / 643
页数：6
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