SIMPLE METHOD FOR OPTICAL-PARAMETER DETERMINATION OF INHOMOGENEOUS THIN-FILMS

被引:17
|
作者
BAH, K
CZAPLA, A
PISARKIEWICZ, T
机构
[1] Inst of Electronics, Krakow, Poland
关键词
D O I
10.1016/0040-6090(93)90755-E
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:18 / 20
页数:3
相关论文
共 50 条
  • [31] CHARACTERIZATION OF OPTICAL THIN-FILMS
    PULKER, HK
    APPLIED OPTICS, 1979, 18 (12): : 1969 - 1977
  • [32] DETERMINATION OF OPTICAL-CONSTANTS OF POLYMERIC THIN-FILMS BY INTEGRATED OPTICAL TECHNIQUES
    SWALEN, JD
    TACKE, M
    SANTO, R
    FISCHER, J
    OPTICS COMMUNICATIONS, 1976, 18 (03) : 387 - 390
  • [33] MICROSTRUCTURE OF OPTICAL THIN-FILMS
    MACLEOD, HA
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1982, 325 : 21 - 28
  • [34] OPTICAL THIN-FILMS - INTRODUCTION
    SEDDON, RI
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1982, 325 : R6 - R7
  • [35] OPTICAL MODULATION IN THIN-FILMS
    TAYLOR, HF
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01): : 150 - 155
  • [36] Determination of the optical constant profiles of thin weakly absorbing inhomogeneous films
    Liou, Yeuh-Yeong
    Lee, Cheng-Chung
    Jaing, Cheng-Chung
    Chu, Cheng-Wei
    Hsu, Jin-Cherng
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1995, 34 (4 A): : 1952 - 1957
  • [37] A SIMPLE METHOD FOR ELECTRON-PROBE DETERMINATION OF THICKNESS OF THIN-FILMS BY MONTE-CARLO SIMULATION
    HO, YC
    HUANG, YH
    SCANNING ELECTRON MICROSCOPY, 1982, : 559 - 562
  • [38] A METHOD FOR THE DETERMINATION OF GOLD THIN-FILMS MECHANICAL-PROPERTIES
    JOU, JH
    LIAO, CN
    JOU, KW
    THIN SOLID FILMS, 1994, 238 (01) : 70 - 72
  • [39] OPTICAL ANALYSIS OF INHOMOGENEOUS WEAKLY ABSORBING THIN-FILMS BY SPECTROSCOPIC REFLECTOMETRY - APPLICATION TO CARBON-FILMS
    OHLIDAL, I
    NAVRATIL, K
    THIN SOLID FILMS, 1988, 162 (1-2) : 101 - 109
  • [40] NEW METHOD FOR DETERMINING THE NONLINEAR OPTICAL COEFFICIENTS OF THIN-FILMS
    HASE, Y
    KUMATA, K
    KANO, SS
    OHASHI, M
    KONDO, T
    ITO, R
    SHIRAKI, Y
    APPLIED PHYSICS LETTERS, 1992, 61 (02) : 145 - 146