APPARATUS FOR MEASURING THERMAL-CONDUCTIVITY OF THERMOELECTRIC-MATERIALS AT HIGH-TEMPERATURES

被引：0

作者：

PETROV, AV ^{[1
]}

TSYPKINA, NS ^{[1
]}

机构：

[1] AF IOFFE ENGN PHYS INST,LENINGRAD,USSR

来源：

HIGH TEMPERATURE | 1977年 / 15卷 / 01期

关键词：

D O I：

暂无

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：119 / 124

页数：6

共 50 条

[41] APPARATUS FOR DETERMINING THE THERMAL-CONDUCTIVITY OF CERAMIC MATERIALS
VED, VE
IVANOV, VA
LUSHPENKO, SF
INDUSTRIAL LABORATORY, 1992, 58 (11): : 1062 - 1066
[42] UNIT FOR INVESTIGATING THERMAL-CONDUCTIVITY OF ALKALI-METAL VAPORS AT HIGH-TEMPERATURES
VOSHCHININ, AA
KAPITONOV, VM
INDUSTRIAL LABORATORY, 1980, 46 (09): : 942 - 944
[43] THERMAL-CONDUCTIVITY OF LITHIUM-CHLORIDE AQUEOUS-SOLUTIONS AT HIGH-TEMPERATURES
PEPINOV, RI
GUSEINOV, GM
ZHURNAL FIZICHESKOI KHIMII, 1993, 67 (06): : 1101 - 1103
[44] AN APPARATUS FOR EXAMINING THE THERMAL-CONDUCTIVITIES OF CONSTRUCTIONAL MATERIALS AT HIGH-TEMPERATURES
PELETSKII, VE
PATRUSHEVA, LG
HIGH TEMPERATURE, 1986, 24 (01) : 122 - 127
[45] IMPROVED APPARATUS FOR MEASURING THE THERMAL-CONDUCTIVITY OF CRYOGENIC INSULATION
SHARMA, RG
KISHAN, H
TRIPATHI, TC
INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1978, 16 (11) : 1004 - 1006
[46] URANIUM-CARBIDE - THERMAL-DIFFUSIVITY, THERMAL-CONDUCTIVITY AND SPECTRAL EMISSIVITY AT HIGH-TEMPERATURES
DECONINCK, R
VANLIERDE, W
GIJS, A
JOURNAL OF NUCLEAR MATERIALS, 1975, 57 (01) : 69 - 76
[47] EXPERIMENTAL APPARATUS FOR MEASURING THE THERMAL-DIFFUSIVITY OF PURE FLUIDS AT HIGH-TEMPERATURES
KRUPPA, B
JANY, P
STRAUB, J
INTERNATIONAL JOURNAL OF THERMOPHYSICS, 1988, 9 (06) : 911 - 921
[48] APPARATUS FOR TESTING MOLD MATERIALS AT HIGH-TEMPERATURES
USTINOV, VI
MIKHAILOV, AM
INDUSTRIAL LABORATORY, 1976, 42 (11): : 1757 - 1758
[49] A PLANE-WAVE TECHNIQUE FOR MEASURING THE THERMAL-CONDUCTIVITY OF DIELECTRIC MATERIALS AT HIGH-PRESSURES AND TEMPERATURES
SIGALAS, I
PIERRUS, J
PHYSICA B & C, 1986, 139 (1-3): : 159 - 162
[50] MEASUREMENT OF THERMAL-CONDUCTIVITY OF ARGON-NITROGEN GAS-MIXTURES AT HIGH-TEMPERATURES
JORDAN, DL
SWIFT, JD
INTERNATIONAL JOURNAL OF ELECTRONICS, 1973, 35 (05) : 595 - 608

← 1 2 3 4 5 →