ANALYTICAL ELECTRON-MICROSCOPY USING A FIELD-EMISSION GUN

被引：0
|
作者：
BENTLEY, J [1 ]
机构：
[1] OAK RIDGE NATL LAB,OAK RIDGE,TN 37830
来源：
JOURNAL OF METALS | 1979年 / 31卷 / 12期
关键词：
D O I：
暂无
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
引用
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页码：135 / 136
页数：2
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