LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE WITH A RELIABLE PIEZOELECTRICAL COARSE APPROACH MECHANISM

被引：17
|
作者：
ALTFEDER, IB
VOLODIN, AP
机构：
[1] LEIDEN UNIV,KAMERLINGH ONNES LAB,2300 RA LEIDEN,NETHERLANDS
[2] KAPITZA INST PHYS PROBLEMS,117334 MOSCOW,RUSSIA
[3] MOSCOW INST STEEL & ALLOYS,MOSCOW,RUSSIA
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1993年 / 64卷 / 11期
关键词：
D O I：
10.1063/1.1144324
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The design of a compact low-temperature scanning tunneling microscope (STM) with a reliably operated piezoelectrical coarse approach system is described. The tip translation device is based on a new principle of sequential and parallel longitudinal step motions of the balanced frictional supports of the STM tip. The instrument was successfully tested in a temperature range from 0.4 to 300 K. The design is well suited for low-temperature applications.
引用
收藏
页码：3157 / 3160
页数：4
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