POSSIBILITY OF INVESTIGATING THE INHOMOGENEITY OF SEMICONDUCTOR MATERIALS BY USING PROBE METHODS

被引：0
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作者：
ORZHEVSKII, OB
FISTUL, VI
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来源：
INDUSTRIAL LABORATORY | 1961年 / 27卷 / 10期
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暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
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页码：1239 / 1242
页数：4
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