INTEGRATED COST AND PRODUCTIVITY LEARNING IN CMOS SEMICONDUCTOR MANUFACTURING

被引:2
|
作者
LEONOVICH, GA [1 ]
FRANCHINO, AP [1 ]
MILLER, WJ [1 ]
TSOU, UE [1 ]
机构
[1] IBM CORP,SOMERS,NY 10589
关键词
D O I
10.1147/rd.391.0201
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This paper describes a cost and productivity learning process that was carried out on a large-capacity CMOS manufacturing line at the IBM Burlington facility from 1991 to 1993. Major productivity gains were realized through process and tool improvements affecting yield, and through work-in-progress optimization and scrap reduction. Significant cost learning was also accomplished through tool cost management, capital depreciation and space cost reductions. and manpower optimization.
引用
收藏
页码:201 / 213
页数:13
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