Structural investigation of the Ca/Si(111)-(3x2) surface using photoelectron diffraction

被引:0
|
作者
Suzuki, Toshihiro [1 ]
Sakamoto, Kazuyuki [1 ]
Abukawa, Tadashi [2 ]
Kono, Shozo [2 ]
机构
[1] Tohoku Univ, Grad Sch Sci, Dept Phys, Sendai, Miyagi 9808578, Japan
[2] Tohoku Univ, Inst Multidisciplinary Res Adv Mat, Sendai, Miyagi 9808577, Japan
关键词
1-D atomic chains; Photoelectron diffraction; Silicon; Surface structure;
D O I
10.1380/ejssnt.2006.166
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The atomic structure of the Ca induced Si(111)-(3x2) surface at 300 K has been investigated using X-ray photoelectron diffraction (XPD). After confirming the quality of the single-domain (3x2) surface by LEED, in which weak x2 streaks were observed likewise the patterns reported in the literature, we have measured the Ca 2p core-level spectra within an azimuthal angle range of +/- 66 degrees, where 0 degrees corresponds to the direction perpendicular to the Ca chain, and at takeoff angles from 9 degrees to 15 degrees using the Mg Ka line. The experimental XPD patterns showed good agreement with the simulated XPD patterns of the T-4 site model, while the simulated XPD patterns of the H-3 model do not agree with the experimental results. Taking these results into account, we conclude that Ca atoms are adsorbed on the T-4 site at 300 K and thus that the weak x2 streaks do not result from the presence of two adsorption sites as proposed in the literature.
引用
收藏
页码:166 / 169
页数:4
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