PYROELECTRIC TECHNOLOGY IN MODERN THERMAL IMAGING-SYSTEMS

被引：0

作者：

FOREMAN, JR ^{[1
]}

机构：

[1] THOMSON CSF,F-91401 ORSAY,FRANCE

来源：

ELECTRONIC ENGINEERING | 1977年 / 49卷 / 587期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：38 / &

共 50 条

[1] THERMAL IMAGING-SYSTEMS PRINCIPLES
LLOYD, M
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1976, 66 (04) : 389 - 389
[2] TESTING THERMAL IMAGING-SYSTEMS
WILLIAMS, TL
HUNT, R
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1981, 274 : 273 - 279
[3] NEW DETECTOR FOR THERMAL IMAGING-SYSTEMS
ELLIOTT, CT
ELECTRONICS LETTERS, 1981, 17 (08) : 312 - 313
[4] TEST FACILITY FOR THERMAL IMAGING-SYSTEMS
FONTANELLA, JC
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1981, 274 : 280 - 286
[5] LIGHT DIODES IN THERMAL IMAGING-SYSTEMS
SHIROBOKOV, AM
KARIZHENSKII, EY
VIOLIN, EE
KASATKIN, VA
IZOTOV, VA
SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1977, 44 (09): : 551 - 553
[6] NEW DEVELOPMENTS IN THERMAL IMAGING-SYSTEMS
FREDERICKSON, DW
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1982, 371 : 240 - 245
[7] ADVANCED THERMAL IMAGING-SYSTEMS AND THEIR COMMERCIAL APPLICATIONS
DEMAINE, D
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1983, 376 : 85 - 86
[8] INFLIGHT RESOLUTION EVALUATION FOR THERMAL IMAGING-SYSTEMS
SHIMER, SE
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1985, 510 : 42 - 48
[9] CHARACTERIZATION AND EVALUATION OF NARCISSUS IN THERMAL IMAGING-SYSTEMS
HOWARD, JW
ABEL, IR
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1981, 71 (12) : 1648 - 1648
[10] NARCISSUS - REFLECTIONS ON RETROREFLECTIONS IN THERMAL IMAGING-SYSTEMS
HOWARD, JW
ABEL, IR
APPLIED OPTICS, 1982, 21 (18): : 3393 - 3397