On the factors affecting the reflection intensities by the several methods of x-ray analysis of crystal structures

被引：33
作者：
Blake, FC [1 ]
机构：
[1] Ohio State Univ, Mendenhall Lab Phys, Columbus, OH USA
来源：
REVIEWS OF MODERN PHYSICS | 1933年 / 5卷 / 03期
关键词：
D O I：
10.1103/RevModPhys.5.169
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：0169 / 0202
页数：34
相关论文
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