RADIATION-DAMAGE TEST OF SILICON MULTISTRIP DETECTORS

被引：22
|
作者：
NAKAMURA, M [1 ]
TOMITA, Y [1 ]
NIWA, K [1 ]
KONDO, T [1 ]
机构：
[1] KEK,NATL LAB HIGH ENERGY PHYS,IBARAKI 304,JAPAN
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1988年 / 270卷 / 01期
关键词：
D O I：
10.1016/0168-9002(88)90007-1
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：42 / 55
页数：14
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