HALL-COEFFICIENTS OF ND2-XCEXCUO4 THIN-FILMS

被引:29
|
作者
KUBO, S
SUZUKI, M
机构
[1] NTT Applied Electronics Laboratories, Nippon Telegraph and Telephone Corporation, 162 Tokai, Ibaraki
来源
关键词
Concentration Dependence - Neodymium Cerium Copper Oxides - Oxide Superconductors;
D O I
10.1016/0921-4534(91)91849-Y
中图分类号
O59 [应用物理学];
学科分类号
摘要
Cerium concentration dependence of Hall coefficient in Nd2-xCexCuO4 thin films has been examined. It is confirmed that the Hall coefficient R(H) at Ce concentrations of x approximately 0.15 where the superconducting critical temperature T(c) becomes maximum is negative. It is found, however, that R(H) changes rapidly for positive behavior with a small increase of Ce concentration, and finally becomes completely positive in the whole temperature range below 300 K at Ce concentration values where the system is still superconductive. A confusion in the sign of the carriers in bulk samples is thought to originate from a Ce distribution nonuniformity in these samples.
引用
收藏
页码:1251 / 1252
页数:2
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