AUGER EXCITATION BY INTERNAL SECONDARY ELECTRONS

被引：19

作者：

HOUSTON, JE

PARK, RL

机构：

[1] Sandia Laboratories, Albuquerque

来源：

APPLIED PHYSICS LETTERS | 1969年 / 14卷 / 11期

关键词：

D O I：

10.1063/1.1652685

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Electron-excited Auger spectroscopy, as it is presently applied, utilizes incident beam energies which are normally greater than that corresponding to the maximum ionization cross section. Preliminary measurements indicate that Auger emission at these high primary energies is significantly enhanced due to excitation by internal secondary electrons. This creates a serious problem with respect to the use of Auger spectroscopy as an analytical tool. © 1969 The American Institute of Physics.

引用

页码：358 / &