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- [2] A SPECTROCHEMICAL METHOD FOR DETERMINING SILICON IN SILICONE RESIN SOLUTIONSSPECTROCHIMICA ACTA, 1956, 8 (02): : 108 - 108RUDOLPH, J
- [3] SPECTROCHEMICAL METHOD OF DETERMINING TRACE IMPURITIES IN GERMANIUM AND GERMANIUM DIOXIDEINDUSTRIAL LABORATORY, 1962, 28 (06): : 716 - 718VASILEVSKAYA, LSNOTKINA, MASADOFEVA, SAKONDRASHINA, AI
- [4] A RAPID METHOD OF DETERMINING SILICON DIOXIDEGLASS AND CERAMICS, 1979, 36 (5-6) : 284 - 288SVISTUNOVA, GPTUPITSYNA, EVABRAMOV, VVANDREEV, PASHVETSOVA, LN
- [5] A CHEMICAL AND SPECTROSCOPIC METHOD OF DETERMINING BORON IN SILICON AND SILICON COMPOUNDSINDUSTRIAL LABORATORY, 1962, 28 (06): : 713 - 715VASILEVSKAYA, LSKONDRASHINA, AISHIFRINA, GG
- [6] SPECTROCHEMICAL DETERMINATION OF TRACES OF BORON IN HIGH-PURITY SILICON TETRACHLORIDEINDUSTRIAL LABORATORY, 1962, 28 (06): : 715 - 716PCHELINTSEVA, AFRAKOV, NASLYUSAREVA, LP
- [7] A SPECTROCHEMICAL METHOD FOR DETERMINING RUBIDIUM IN SEA AND SPRING WATERSISRAEL JOURNAL OF CHEMISTRY, 1969, 7 (06) : 831 - +SCHOENFELD, IHELD, S
- [8] PROPERTIES OF BORON IMPLANTED SILICON DIOXIDEAPPLIED SURFACE SCIENCE, 1979, 3 (01) : 83 - 87WOLKENBERG, AWASILEWSKA, B
- [9] BORON EMITTERS: DEFECTS AT THE SILICON - SILICON DIOXIDE INTERFACEPVSC: 2008 33RD IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE, VOLS 1-4, 2008, : 2019 - +Jellett, W.Zhang, C.Jin, H.Smith, P. J.Weber, K. J.