GLOW-DISCHARGE-CREATED ELECTRON-BEAMS - APPLICATIONS IN SOFT-X-RAY EMISSION-SPECTROSCOPY

被引：0
|
作者：
ROMAND, M
GAILLARD, F
CHARBONNIER, M
机构：
来源：
PLASMA SURFACE ENGINEERING, VOLS 1 AND 2 | 1989年
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：759 / 766
页数：8
相关论文
共 50 条
  • [1] GLOW-DISCHARGE-CREATED ELECTRON-BEAMS - CATHODE MATERIALS, ELECTRON-GUN DESIGNS, AND TECHNOLOGICAL APPLICATIONS
    ROCCA, JJ
    MEYER, JD
    FARRELL, MR
    COLLINS, GJ
    JOURNAL OF APPLIED PHYSICS, 1984, 56 (03) : 790 - 797
  • [2] SOFT-X-RAY EMISSION EXCITED BY ELECTRON-BEAMS IN A SUPERLATTICE
    KAPLAN, AE
    DATTA, S
    JOURNAL OF LUMINESCENCE, 1984, 31-2 (DEC) : 690 - 692
  • [3] GLOW-DISCHARGE-CREATED ELECTRON BEAMS: CATHODE MATERIALS, ELECTRON GUN DESIGNS, AND TECHNOLOGICAL APPLICATIONS.
    Rocca, J.J.
    Meyer, J.D.
    Farrell, M.R.
    Collins, G.J.
    1600, (56):
  • [4] SOFT-X-RAY EMISSION-SPECTROSCOPY USING SYNCHROTRON LIGHT EXCITATION
    CALLCOTT, TA
    EDERER, DL
    ARAKAWA, ET
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 447 : 61 - 67
  • [5] SOFT-X-RAY EMISSION-SPECTROSCOPY USING MONOCHROMATIZED SYNCHROTRON RADIATION
    NORDGREN, J
    BRAY, G
    CRAMM, S
    NYHOLM, R
    RUBENSSON, JE
    WASSDAHL, N
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (07): : 1690 - 1696
  • [6] EXPERIMENTAL-STUDY OF A GLOW-DISCHARGE ELECTRON SOURCE FOR SOFT-X-RAY SPECTROSCOPY
    LEGRAND, PB
    DAUCHOT, JP
    HECQ, M
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1991, 139 : 144 - 149
  • [7] APPLICATION OF A POSITION-SENSITIVE DETECTOR TO SOFT-X-RAY EMISSION-SPECTROSCOPY
    ZAHOROWSKI, W
    MITTERNACHT, J
    WIECH, G
    MEASUREMENT SCIENCE AND TECHNOLOGY, 1991, 2 (07) : 602 - 609
  • [8] AN EXAMINATION OF THE ELECTRONIC-STRUCTURE OF SIO BY SOFT-X-RAY EMISSION-SPECTROSCOPY
    SCIMECA, T
    SOLID STATE COMMUNICATIONS, 1991, 77 (10) : 817 - 819
  • [9] MONITORING OF THE ALUMINUM NITRIDE SPUTTERING DEPOSITION BY SOFT-X-RAY EMISSION-SPECTROSCOPY
    LEGRAND, PB
    DAUCHOT, JP
    HECQ, M
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1992, 10 (04): : 945 - 949
  • [10] ELECTRONIC BONDING OF BURIED INTERFACES DETERMINED BY SOFT-X-RAY EMISSION-SPECTROSCOPY
    PERERA, RCC
    ZHANG, CH
    CALLCOTT, TA
    EDERER, DL
    JOURNAL OF APPLIED PHYSICS, 1989, 66 (08) : 3676 - 3681
12345