Investigation of Temperature Dependence for CNT Semiconductor in External Magnetic Field

被引：0

作者：

Park, Jung-Il ^{[1
]}

Lee, Haeng-Ki ^{[2
]}

机构：

[1] Kyungpook Natl Univ, Dept Phys, Nanophys & Technol Lab, Daegu 702701, South Korea

[2] Suseong Coll, Dept Radiotechnol, Daegu 706711, South Korea

来源：

JOURNAL OF THE KOREAN MAGNETICS SOCIETY | 2012年 / 22卷 / 03期

关键词：

electron spin resonance (ESR); projection operator method (POM); carbon nanotube; zigzag; line-width; electron spin relaxation;

D O I：

10.4283/JKMS.2012.22.3.073

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We calculated the electron spin resonance (ESR) line-profile function. The line-width of single-walled carbon nanotube (SWNT) was studied as a function of the temperature at a frequency of 9.5 GHz in the presence of external electromagnetic radiation. The temperature dependence of the line-widths is obtained with the projection operator method (POM) proposed by Argyres and Sigel. The scattering is little affected in the low-temperature region (T < 200 K). We conclude that the calculation process presented in this method is useful for optical transitions in SWNT.

引用

页码：73 / 78

页数：6

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