MULTIPLE REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION BEAM INTENSITY MEASUREMENT SYSTEM

被引：6
|
作者：
RESH, JS
JAMISON, KD
STROZIER, J
IGNATIEV, A
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1990年 / 61卷 / 02期
关键词：
D O I：
10.1063/1.1141492
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A video-based analysis system for reflection high-energy electron diffraction (RHEED) is described which simultaneously measures the intensities and profiles of multiple diffraction beams. This system is used to record real-time RHEED intensity oscillations for layer-by-layer epitaxial growth. Fast Fourier transform analysis of the oscillation data is used to directly determine the growth rate and to accurately obtain phase information about the oscillations. This system is demonstrated and compared to other methods of recording RHEED oscillation data.
引用
收藏
页码：771 / 774
页数：4
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