TRANSVERSE SWEEP-OUT EFFECTS IN INSB IN CROSSED ELECTRIC AND MAGNETIC-FIELDS

被引：11

作者：

MALYUTENKO, VK ^{[1
]}

TESLENKO, GI ^{[1
]}

BOIKO, II ^{[1
]}

机构：

[1] ACAD SCI UKSSR, SEMICONDU INST, KIEV, UKSSR

来源：

INFRARED PHYSICS | 1973年 / 13卷 / 04期

关键词：

D O I：

10.1016/0020-0891(73)90045-6

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：337 / +

页数：1

共 50 条

[1] RESPONSIVITY OF INSB PHOTODETECTOR UNDER TRANSVERSE SWEEP-OUT CONDITIONS
MALYUTENKO, VK
TESLENKO, GI
BOIKO, II
INFRARED PHYSICS, 1974, 14 (04): : 351 - 352
[2] ACOUSTIC AMPLIFICATION IN INSB IN CROSSED ELECTRIC AND MAGNETIC-FIELDS
DUNCAN, W
LIVINGSTONE, J
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1972, 10 (01): : 139 - +
[3] DETECTION OF ULTRASHORT LASER PULSES BY TRANSVERSE SWEEP-OUT INSB DETECTOR
BOLGOV, SS
MALYUTENKO, VK
PESHKO, II
SOSKIN, MS
FEDORENKO, LL
KHIZNIAK, AI
INFRARED PHYSICS, 1975, 15 (01): : 65 - 66
[4] SPECTROSCOPY OF INVERSION ELECTRONS ON INSB IN CROSSED ELECTRIC AND MAGNETIC-FIELDS
OELTING, S
MERKT, U
KOTTHAUS, JP
SURFACE SCIENCE, 1986, 170 (1-2) : 402 - 407
[5] CONVECTIVE INSTABILITY IN NORMAL-INSB IN PRESENCE OF CROSSED ELECTRIC AND MAGNETIC-FIELDS
GUHA, S
GHOSH, S
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1977, 41 (01): : 249 - 254
[6] PHOTOCONDUCTORS UNDER TRANSVERSE SWEEP-OUT CONDITIONS
MALYUTENKO, VK
TESLENKO, GI
INFRARED PHYSICS, 1985, 25 (1-2): : 337 - 342
[7] ATOMS IN CROSSED ELECTRIC AND MAGNETIC-FIELDS
LITTMAN, MG
KOREVAAR, E
JOURNAL DE PHYSIQUE, 1982, 43 (NC2): : 455 - 456
[8] ACCUMULATION OF FREE-CARRIERS ON THE SURFACE OF INSB SUBJECTED TO CROSSED ELECTRIC AND MAGNETIC-FIELDS
ALMAZOV, LA
LIPTUGA, AI
MALYUTENKO, VK
SOVIET PHYSICS SEMICONDUCTORS-USSR, 1979, 13 (01): : 30 - 33
[9] PROPAGATION AND INSTABILITY OF MICROWAVES IN EXTRINSIC INSB SUBJECT TO CROSSED STATIC ELECTRIC AND MAGNETIC-FIELDS
HSIEH, HC
PHYSICAL REVIEW B, 1974, 10 (10): : 4297 - 4304
[10] EFFECTS OF ELECTRIC AND MAGNETIC-FIELDS ON PROPAGATION CHARACTERISTICS OF MICROWAVES IN INSB
GUPTA, PN
RAM, M
TOLPADI, SK
INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1983, 21 (09) : 537 - 539

← 1 2 3 4 5 →