EPITAXIAL GROWTH OF INDIUM ANTIMONIDE FILMS AS STUDIED IN SITU BY ELECTRON DIFFRACTION

被引：15
|
作者：
KHAN, IH
机构：
来源：
SURFACE SCIENCE | 1968年 / 9卷 / 02期
关键词：
D O I：
10.1016/0039-6028(68)90180-5
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：306 / &
相关论文
共 50 条
  • [41] PREPARATION OF INDIUM ANTIMONIDE AND GALLIUM ARSENIDE FILMS
    HARRISON, BC
    TOMPKINS, EH
    INORGANIC CHEMISTRY, 1962, 1 (04) : 951 - &
  • [42] Erratum to: Electrical and Optical Characterization of Electron Beam Evaporated Indium Antimonide Thin Films
    A. K. Rahul
    R. S. N. Verma
    S. R. Tripathi
    National Academy Science Letters, 2012, 35 : 577 - 577
  • [43] Effect of Growth Temperature on the Indium Incorporation in InGaN Epitaxial Films
    Chang, P. C.
    Yu, C. L.
    Jahn, Y. W.
    Chang, S. J.
    Lee, K. H.
    APPLICATIONS OF ENGINEERING MATERIALS, PTS 1-4, 2011, 287-290 : 1456 - +
  • [44] Electron and phonon dynamics in indium antimonide crystals
    Romuald Brazis
    Romas Raguotis
    Optical and Quantum Electronics, 2008, 40 : 249 - 252
  • [45] Electron and phonon dynamics in indium antimonide crystals
    Brazis, Romuald
    Raguotis, Romas
    OPTICAL AND QUANTUM ELECTRONICS, 2008, 40 (2-4) : 249 - 252
  • [46] Growth of thin epitaxial alumina films onto Ni(111): an electron spectroscopy and diffraction study
    Nemsak, Slavomir
    Skala, Tomas
    Yoshitake, Michiko
    Tsud, Nataliya
    Kim, Taeyoung
    Yagyu, Shinjiro
    Matolin, Vladimir
    SURFACE AND INTERFACE ANALYSIS, 2010, 42 (10-11) : 1581 - 1584
  • [47] SCANNING ELECTRON-DIFFRACTION SYSTEM FOR IN-SITU ALKALI ANTIMONIDE PHOTOCATHODE STUDIES
    BECK, AH
    ROBBIE, JC
    INTERNATIONAL JOURNAL OF ELECTRONICS, 1972, 33 (04) : 361 - &
  • [48] Influence of indium supply on Au-catalyzed InGaAs nanowire growth studied by in situ X-ray diffraction
    Sasaki, Takuo
    Takahasi, Masamitu
    JOURNAL OF CRYSTAL GROWTH, 2017, 468 : 135 - 138
  • [49] Epitaxial growth of Sb/Ge/Si(111) studied by photoelectron diffraction
    Westphal, C
    Sokeland, F
    Dreiner, S
    Zacharias, H
    SURFACE REVIEW AND LETTERS, 1998, 5 (01) : 151 - 155
  • [50] In situ reflection high-energy electron diffraction observation of epitaxial LaNiO3 thin films
    Chen, P
    Xu, SY
    Zhou, WZ
    Ong, CK
    Cui, DF
    JOURNAL OF APPLIED PHYSICS, 1999, 85 (05) : 3000 - 3002
12345