RADIATION DAMAGE IN SIO2 STRUCTURES

被引：120
|
作者：
WITTELS, M
SHERRILL, FA
机构：
来源：
PHYSICAL REVIEW | 1954年 / 93卷 / 05期
关键词：
D O I：
10.1103/PhysRev.93.1117.2
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：1117 / 1118
页数：2
相关论文
共 50 条
  • [1] EFFECTS OF PROCESSING ON RADIATION-DAMAGE IN SIO2
    GDULA, RA
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (04) : 644 - 647
  • [2] Simulation of Radiation Effects in SiO2/Si Structures
    Komarov, F. F.
    Zayats, G. M.
    Komarov, A. F.
    Miskiewicz, S. A.
    Michailov, V. V.
    Komsta, H.
    ACTA PHYSICA POLONICA A, 2015, 128 (05) : 857 - 860
  • [3] RADIATION-DAMAGE AND THE ROLE OF STRUCTURE IN AMORPHOUS SIO2
    DEVINE, RAB
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1990, 46 (1-4): : 244 - 251
  • [4] Photoluminescence from SiO2/Si/SiO2 structures
    Photopoulos, P
    Nassiopoulou, AG
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2003, 15 (21) : 3641 - 3650
  • [5] RADIATION DAMAGE IN RADIO-FREQUENCY-SPUTTERED SIO2 FILMS
    HICKMOTT, TW
    APPLIED PHYSICS LETTERS, 1969, 15 (07) : 232 - &
  • [6] RADIATION-DAMAGE IN SIO2/SI INDUCED BY VUV PHOTONS
    YUNOGAMI, T
    MIZUTANI, T
    SUZUKI, K
    NISHIMATSU, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1989, 28 (10): : 2172 - 2176
  • [7] Effects of ionizing radiation on laser-induced damage in SiO2
    Soileau, M.J.
    Mansour, N.
    Canto, E.
    Griscom, D.L.
    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 1988, B32 (1-4) : 311 - 314
  • [8] EFFECT OF BETA-RADIATION ON MIS STRUCTURES WITH THIN SIO2
    KASCHIEVA, SB
    TONCHEVA, LT
    MATEV, IT
    DOKLADI NA BOLGARSKATA AKADEMIYA NA NAUKITE, 1976, 29 (11): : 1601 - 1603
  • [9] EFFECTS OF OXIDATION AND REDUCTION ON RADIATION-DAMAGE IN SIO2 AND GEO2
    GINTHER, RJ
    KIRK, RD
    SIGEL, GH
    FRIEBELE, EJ
    AMERICAN CERAMIC SOCIETY BULLETIN, 1973, 52 (09): : 704 - 704
  • [10] Characterization of X-ray radiation damage in Si/SiO2 structures using second-harmonic generation
    Marka, Z
    Singh, SK
    Wang, W
    Lee, SC
    Kavich, J
    Glebov, B
    Rashkeev, SN
    Karmarkar, AP
    Albridge, RG
    Pantelides, ST
    Schrimpf, RD
    Fleetwood, DM
    Tolk, NH
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2000, 47 (06) : 2256 - 2261
12345