THICKNESS DEPENDENCE OF FRACTURE-STRESS IN GLASS-FILMS COATED ON SILICON

被引：2
|
作者：
SHIMBO, M
机构：
来源：
JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1988年 / 71卷 / 10期
关键词：
D O I：
10.1111/j.1151-2916.1988.tb07515.x
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：C424 / C426
页数：3
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