X-RAY-DIFFRACTION INVESTIGATION OF STRUCTURAL DISTORTION IN CRYSTALS WITH A DISTURBED SURFACE-LAYER

被引：0
|
作者：
NIKOLAEV, VV
KHRUPA, VI
KRASULYA, SM
机构：
来源：
INDUSTRIAL LABORATORY | 1994年 / 60卷 / 03期
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D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
An experimental method allowing the testing of defects in the bulk of single crystals with a surface layer damaged by mechanical treatment is described. The subject of the investigation were silicon crystals, grown by the crucibleless zone melting and Czochralski methods.
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页码：161 / 163
页数：3
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