APPLICATION OF SCANNING TUNNELING MICROSCOPE TO HIGH-SPEED OPTICAL-SAMPLING MEASUREMENT

被引：5
|
作者：
TAKEUCHI, K
MIZUHARA, A
KASAHARA, Y
机构：
[1] Teratec Corporation, 2-9-32 Naka-cho, Musashinoshi
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1995年 / 44卷 / 03期
关键词：
D O I：
10.1109/19.387340
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A novel method of measuring high-speed electrical waveforms using a scanning tunneling microscope (STM) is demonstrated. An optical pulse train is used to turn on and off the photoconductive semiconductor switch (PCSS) on the STM probe to measure a high-speed signal in an equivalent sampling procedure. A temporal resolution of 160 ps has been achieved, This unique combination of optical sampling and STM technology is a breakthrough for measuring ultra-high-speed waveforms.
引用
收藏
页码：815 / 818
页数：4
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