X-RAY-DIFFRACTION STUDY OF DIFFUSION DISTRIBUTION OF COMPONENTSIN THIN COATINGS

被引：0
|
作者：
BATALOV, GV
GAIDUCHE.BI
机构：
[1] MOSCOW HARDWARE IND INST,MOSCOW,USSR
[2] NOSOV MIN MET INST,MAGNITOGORSK,USSR
来源：
ZAVODSKAYA LABORATORIYA | 1973年 / 39卷 / 05期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：555 / 557
页数：3
相关论文
共 50 条
  • [1] THICKNESS DETERMINATION OF THIN COATINGS BY OBLIQUE X-RAY-DIFFRACTION PATTERNS
    BEKRENEV, AN
    FEDOROV, BN
    INDUSTRIAL LABORATORY, 1979, 45 (10): : 1111 - 1114
  • [2] X-RAY-DIFFRACTION STUDY OF THIN-FILM TEXTURES
    FREIK, DM
    GAIDUCHO.GM
    VOITKIV, VV
    MAKSIMYA.LB
    PRIBORY I TEKHNIKA EKSPERIMENTA, 1972, (04): : 224 - &
  • [3] X-RAY-DIFFRACTION STUDY OF THIN POROUS SILICON LAYERS
    LOMOV, AA
    BELLET, D
    DOLINO, G
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1995, 190 (01): : 219 - 226
  • [4] APPLICATION OF X-RAY-DIFFRACTION IN THE STUDY OF THIN GAN LAYERS
    FREMUNT, R
    ROSICKA, V
    CHEMICKE LISTY, 1980, 74 (04): : 424 - 427
  • [5] AN X-RAY-DIFFRACTION STUDY OF THE PROCESSES OF FORMATION OF VANADIUM COATINGS ON DIAMOND
    CHUPRINA, VG
    SHURKHAL, VV
    SOVIET POWDER METALLURGY AND METAL CERAMICS, 1987, 26 (03): : 269 - 272
  • [6] X-RAY-DIFFRACTION STUDY OF CONCENTRATIONAL DEPENDENCE OF DIFFUSION-COEFFICIENT
    FOGELSON, RL
    FIZIKA METALLOV I METALLOVEDENIE, 1982, 53 (04): : 796 - 800
  • [7] X-RAY-DIFFRACTION STUDY OF NAF
    HOWARD, CJ
    JONES, RDG
    ACTA CRYSTALLOGRAPHICA SECTION A, 1977, 33 (SEP1): : 776 - 783
  • [8] APPLICATION OF X-RAY-DIFFRACTION TO STUDY OF THIN SEMICONDUCTOR-FILMS
    SCHILLER, C
    VIDE-SCIENCE TECHNIQUE ET APPLICATIONS, 1990, 45 (251): : 127 - 128
  • [9] X-RAY-DIFFRACTION STUDY OF GALLSTONES
    ARNAUD, JP
    APRAHAMIAN, M
    ELOY, MR
    ADLOFF, M
    DIGESTION, 1978, 18 (1-2) : 142 - 142
  • [10] AN X-RAY-DIFFRACTION STUDY OF POTASSIUM
    BEDNARZ, B
    FIELD, DW
    ACTA CRYSTALLOGRAPHICA SECTION A, 1982, 38 (JAN): : 3 - 10
12345