共 14 条
- [1] PROFILE OF THE EDGE LUMINESCENCE BAND OF INGAASP/INP DOUBLE HETEROSTRUCTURES (LAMBDA=1.3-MU) AT LOW AND HIGH PHOTOEXCITATION RATES SOVIET PHYSICS SEMICONDUCTORS-USSR, 1983, 17 (09): : 1052 - 1054
- [2] RADIATIVE AND AUGER PROCESSES IN A PHOTOEXCITED ELECTRON-HOLE PLASMA IN INGAASP/INP DOUBLE HETEROSTRUCTURES (LAMBDA=1.3-MU) SOVIET PHYSICS SEMICONDUCTORS-USSR, 1983, 17 (09): : 992 - 995
- [3] INFLUENCE OF THE LUMINESCENCE SATURATION EFFECT ON THE LASING THRESHOLD OF INGAASP/INP DOUBLE HETEROSTRUCTURE LASERS (LAMBDA=1.3-MU) AT T GREATER-THAN-OR-EQUAL-TO 300-K SOVIET PHYSICS SEMICONDUCTORS-USSR, 1983, 17 (03): : 338 - 339
- [4] SPECIAL FEATURES OF THE THRESHOLD CHARACTERISTICS OF SEPARATELY CONFINED INGAASP/INP DOUBLE-HETEROSTRUCTURE LASERS (LAMBDA-=1.3-MU) WITH ULTRATHIN ACTIVE REGIONS SOVIET PHYSICS SEMICONDUCTORS-USSR, 1985, 19 (08): : 873 - 875
- [5] AUGER RECOMBINATION AND HEATING OF CARRIERS AT HIGH-RATES OF PHOTOEXCITATION OF INGAASP/INP (LAMBDA=1.3 MU-M) AND INGAASP/GAAS (LAMBDA=0.85 MU-M) QUANTUM-WELL HETEROSTRUCTURES SOVIET PHYSICS SEMICONDUCTORS-USSR, 1988, 22 (04): : 410 - 413
- [6] CHARACTERISTIC FEATURES OF THE TEMPERATURE DEPENDENCES OF THE THRESHOLD OF SEPARATE-CONFINEMENT INGAASP/INP DOUBLE-HETEROSTRUCTURE LASERS (LAMBDA-=1.3-MU) WITH THIN ACTIVE REGIONS SOVIET PHYSICS SEMICONDUCTORS-USSR, 1985, 19 (08): : 920 - 921
- [7] LUMINESCENCE AND THRESHOLD CHARACTERISTICS OF OPTICALLY-EXCITED INGAASP/INP DOUBLE HETEROSTRUCTURES (0.94-LESS-THAN-LAMBDA-LESS-THAN-1.51-MU) SOVIET PHYSICS SEMICONDUCTORS-USSR, 1984, 18 (01): : 61 - 65
- [8] CONTINUOUS INGAASP/INP RO DGS LASER WITH 17-PERCENT (LAMBDA=1.32 MU-M, T=290-K) EFFICIENCY PISMA V ZHURNAL TEKHNICHESKOI FIZIKI, 1985, 11 (19): : 1157 - 1162
- [9] QUANTUM-WELL INGAASP/INP SEPARATE-CONFINEMENT DOUBLE HETEROSTRUCTURE LASERS EMITTING AT LAMBDA=1.3 MU (JTH=410 A/CM2, T= 23-DEGREES-C) SOVIET PHYSICS SEMICONDUCTORS-USSR, 1987, 21 (05): : 503 - 506
- [10] INJECTION SEPARATE-CONFINEMENT INGAASP/INP DOUBLE HETEROSTRUCTURE LASERS WITH A THRESHOLD 300 A/CM2 (SAMPLES CLEAVED ALONG 4 SIDES, LAMBDA=1.25-MU, T=300-K) SOVIET PHYSICS SEMICONDUCTORS-USSR, 1984, 18 (11): : 1281 - 1283