SIGNIFICANCE OF CHARGE-EXCHANGE IN THE DETERMINATION OF YIELDS IN BROAD-BEAM ION ETCHING

被引:4
|
作者
VILLALVILLA, JM
SANTOS, C
VALLESABARCA, JA
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D O I
10.1016/0042-207X(89)90016-X
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T [工业技术];
学科分类号
08 ;
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页码:683 / 685
页数:3
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