EVIDENCE FOR A CLEAN (SQUARE-ROOT 2X SQUARE ROOT 2) R45-DEGREES SURFACE-STRUCTURE ON CR(100)

被引：49

作者：

GEWINNER, G

PERUCHETTI, JC

JAEGLE, A

RIEDINGER, R

机构：

[1] Laboratoire de Physique et de Spectroscopie Electronique, Institut des Sciences Exactes et Appliquées, Université de Haute Alsace, Mulhouse

来源：

PHYSICAL REVIEW LETTERS | 1979年 / 43卷 / 13期

关键词：

D O I：

10.1103/PhysRevLett.43.935

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Low-energy electron diffraction observations of carefully cleaned and annealed Cr(100) surfaces show a sharp and intense (2×2)R45°structure. Auger-electron spectroscopy measurements indicate that this anomalous" structure is actually a clean-surface effect. A strong contamination-sensitive feature is revealed by angle-resolved photoemission and it is suggested that reconstruction results from an instability connected with a peak near EF in the surface density of states of the Cr(100) (1×1) surface. © 1979 The American Physical Society."

引用

页码：935 / 938

页数：4

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