QUANTITATIVE SURFACE ATOMIC GEOMETRY AND TWO-DIMENSIONAL SURFACE ELECTRON-DISTRIBUTION ANALYSIS BY A NEW TECHNIQUE IN LOW-ENERGY ION-SCATTERING

被引：221
作者：
AONO, M
OSHIMA, C
ZAIMA, S
OTANI, S
ISHIZAWA, Y
机构：
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS | 1981年 / 20卷 / 11期
关键词：
D O I：
10.1143/JJAP.20.L829
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：L829 / L832
页数：4
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