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- [1] Determination of the optical constants and thickness of thin films on slightly absorbing substrates Appl. Opt., 34 (7914-7924):
- [3] DETERMINATION OF THE OPTICAL-CONSTANTS AND THICKNESS OF THIN-FILMS ON SLIGHTLY ABSORBING SUBSTRATES APPLIED OPTICS, 1995, 34 (34): : 7914 - 7924
- [4] ELLIPSOMETRIC METHOD FOR MEASUREMENT OF OPTICAL-CONSTANTS AND THICKNESS OF THIN ABSORBING FILMS ON METAL SUBSTRATES OPTIKA I SPEKTROSKOPIYA, 1974, 36 (01): : 199 - 204
- [10] Comparison of ellipsometric methods for separate determination of thickness and optical constants of thin films LIGHTMETRY: METROLOGY, SPECTROSCOPY, AND TESTING TECHNIQUES USING LIGHT, 2001, 4517 : 126 - 133