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- [4] THEORY OF THE ELECTRONIC-STRUCTURE OF THE SI-SIO2 INTERFACE PHYSICAL REVIEW B, 1980, 21 (12): : 5733 - 5744
- [6] ELECTRONIC STATES OF SI-SIO2 INTERFACES BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (03): : 456 - 456
- [8] Nitridation by NO or N2O of Si-SiO2 interfaces ULTRATHIN SIO2 AND HIGH-K MATERIALS FOR ULSI GATE DIELECTRICS, 1999, 567 : 135 - 140
- [9] MODEL OF ELECTRONIC STATES AT THE SI-SIO2 INTERFACE PHYSICAL REVIEW B, 1986, 34 (02): : 872 - 878
- [10] FIELD-DEPENDENT INTERNAL PHOTOEMISSION PROBE OF ELECTRONIC-STRUCTURE OF SI-SIO2 INTERFACE JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (04): : 856 - 859