RELAXED CONTINUOUS RANDOM NETWORK MODELS .1. STRUCTURAL CHARACTERISTICS

被引：162

作者：

STEINHARDT, P ^{[1
]}

ALBEN, R ^{[1
]}

WEAIRE, D ^{[1
]}

机构：

[1] YALE UNIV, DEPT ENGN & APPL SCI, NEW HAVEN, CT 06520 USA

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1974年 / 15卷 / 02期

关键词：

D O I：

10.1016/0022-3093(74)90049-0

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：199 / 214

页数：16

共 21 条

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[2]

ALBEN R, TO BE PUBLISHED

[3] STRUCTURAL, OPTICAL, AND ELECTRICAL PROPERTIES OF AMORPHOUS SILICON FILMS [J].

BRODSKY, MH ;

TITLE, RS ;

WEISER, K ;

PETTIT, GD .

PHYSICAL REVIEW B, 1970, 1 (06) :2632-&

[4] ANISOTROPIC MICROSTRUCTURE IN EVAPORATED AMORPHOUS GERMANIUM FILMS [J].

CARGILL, GS .

PHYSICAL REVIEW LETTERS, 1972, 28 (21) :1372-&

[5]

CONNELL GE, TO BE PUBLISHED

[6]

DUFFY MC, TO BE PUBLISHED

[7]

GRACZYK JF, 1973, B AM PHYS SOC, V18, P420

[8]

GRACZYK JF, TO BE PUBLISHED

[9]

Grigorovici R., 1969, Journal of Non-Crystalline Solids, V1, P371, DOI 10.1016/0022-3093(69)90020-9

[10]

HENDERSON D, 1972, COMPUTATIONAL SOLID

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