MEASUREMENT OF MINORITY-CARRIER LIFETIME IN GAAS USING THE TRANSIENT-RESPONSE OF MOS CAPACITORS

被引：6

作者：

VITALE, G ^{[1
]}

CRISMAN, EE ^{[1
]}

LOFERSKI, JJ ^{[1
]}

ROESSLER, B ^{[1
]}

机构：

[1] UNIV NAPOLI, IST ELETTROTECNICO, I-80125 Naples, ITALY

来源：

APPLIED PHYSICS LETTERS | 1979年 / 34卷 / 01期

关键词：

D O I：

10.1063/1.90598

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：106 / 108

页数：3

共 50 条

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