DEGREE OF LATERAL ORDER IN VARIOUS RAYONS AS DEDUCED FROM X-RAY MEASUREMENTS

被引：41
|
作者：
HERMANS, PH
机构：
来源：
JOURNAL OF POLYMER SCIENCE | 1949年 / 4卷 / 02期
关键词：
D O I：
10.1002/pol.1949.120040204
中图分类号：
O63 [高分子化学（高聚物）];
学科分类号：
070305 ; 080501 ; 081704 ;
摘要：
引用
收藏
页码：145 / 151
页数：7
相关论文
共 50 条
  • [1] DISTRIBUTION OF X-RAY EMISSION FROM SUN DEDUCED FROM MEASUREMENTS OF IONOSPHERIC ABSORPTION
    ANASTASS.M
    BOVIATSO.DS
    NATURE, 1968, 219 (5159) : 1139 - &
  • [2] SOLAR SUPRATHERMAL EVENT DEDUCED FROM X-RAY LINES
    BLAKE, RL
    HOUSE, LL
    ASTROPHYSICAL JOURNAL, 1971, 166 (02): : 423 - &
  • [3] Study of order degree in the structure of kaolinite by X-ray diffraction
    Fu, Jianguo
    Zhang, Zhenru
    Zhongnan Kuangye Xueyuan Xuebao/Journal of Central-South Institute of Mining and Metallurgy, 1988, 19 (06): : 604 - 611
  • [4] STRUCTURE OF DNA AS DEDUCED FROM FIBER X-RAY CRYSTALLOGRAPHY
    WU, TT
    BULLETIN OF MATHEMATICAL BIOLOGY, 1973, 35 (03) : 301 - 311
  • [5] CORRELATION BETWEEN X-RAY AND TEM MEASUREMENTS OF THE DEGREE OF LONG-RANGE ORDER AND DOMAIN SIZE
    PATTEN, DT
    BECKER, PC
    JOURNAL OF METALS, 1979, 31 (08): : F46 - F46
  • [6] DIVISION OF NUCLEAR CHARGE DEDUCED FROM X-RAY MEASUREMENTS IN SPONTANEOUS FISSION OF 252CF
    GLENDENIN, LE
    UNIK, JP
    PHYSICAL REVIEW, 1965, 140 (5B): : 1301 - +
  • [7] THERMOLUMINESCENCE CHARACTERISTICS OF VARIOUS DETECTORS FOR X-RAY DIAGNOSTIC MEASUREMENTS
    RANOGAJECKOMOR, M
    MUHIYEDDIN, F
    MILKOVIC, D
    VEKIC, B
    RADIATION PROTECTION DOSIMETRY, 1993, 47 (1-4) : 529 - 534
  • [8] X-RAY SMALL ANGLE SCATTERING OF RAMIE AND RAYONS
    HEIKENS, D
    HERMANS, PH
    VANVELDEN, PF
    WEIDINGER, A
    JOURNAL OF POLYMER SCIENCE, 1953, 11 (05): : 433 - 446
  • [9] White beam synchrotron X-ray topography and X-ray diffraction measurements of epitaxial lateral overgrowth of GaN
    Chen, WM
    McNally, PJ
    Jacobs, K
    Tuomi, T
    Danilewsky, AN
    Lowney, D
    Kanatharana, J
    Knuuttila, L
    Riikonen, J
    GAN AND RELATED ALLOYS-2001, 2002, 693 : 141 - 146
  • [10] The x-ray surface forces apparatus for simultaneous x-ray diffraction and direct normal and lateral force measurements
    Golan, Y
    Seitz, M
    Luo, C
    Martin-Herranz, A
    Yasa, M
    Li, YL
    Safinya, CR
    Israelachvili, J
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2002, 73 (06): : 2486 - 2488
12345