AUTOREGRESSIVE PROCESS FOR CHARACTERIZING STATISTICALLY ROUGH SURFACES

被引：15

作者：

RASIGNI, G ^{[1
]}

LAFRAXO, M ^{[1
]}

BUAT, V ^{[1
]}

RASIGNI, M ^{[1
]}

ABDELLANI, F ^{[1
]}

LLEBARIA, A ^{[1
]}

机构：

[1] LAB ASTRON SPATIALE TRAVERSE SIPHON,F-13012 MARSEILLE,FRANCE

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1993年 / 10卷 / 06期

关键词：

D O I：

10.1364/JOSAA.10.001257

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

It is shown that rough surfaces of thin silver films deposited on LiF underlayers may be accurately described by a low-order autoregressive process. The autoregressive (AR) parameters are determined, and the advantages of describing statistically rough surfaces of thin deposits by linear models instead of with the traditional autocovariance function (ACF) or the profile power-spectral-density function (PPSDF) are discussed.

引用

页码：1257 / 1262

页数：6

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