Greater sensitivity in ballistic measurements

被引：0
|
作者：
Hill, HE
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1935年 / 6卷 / 07期
关键词：
D O I：
10.1063/1.1751979
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：205 / 206
页数：2
相关论文
共 50 条
  • [1] HIGH SENSITIVITY BALLISTIC FLUXMETER
    POHM, AV
    RUBENS, SM
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1956, 27 (05): : 306 - 308
  • [2] On the sensitivity of ballistic galvanometers.
    Wilson, E
    PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1922, 34 : 0055 - 0065
  • [3] Use of Photography in Ballistic Measurements
    Merritt, George E.
    JOURNAL OF THE SOCIETY OF MOTION PICTURE & TELEVISION ENGINEERS, 1954, 63 (06): : 240 - 244
  • [4] Dynamics and thermal sensitivity of ballistic and non-ballistic feeding in salamanders
    Deban, Stephen M.
    Scales, Jeffrey A.
    JOURNAL OF EXPERIMENTAL BIOLOGY, 2016, 219 (03): : 431 - 444
  • [5] A SIMPLE BALLISTIC TECHNIQUE FOR MAGNETIZATION MEASUREMENTS
    SIMPSON, AW
    BRAMBLEY, DR
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1970, 3 (06): : 472 - &
  • [6] Artifacts in ballistic magnetoresistance measurements (invited)
    Egelhoff, WF
    Gan, L
    Ettedgui, H
    Kadmon, Y
    Powell, CJ
    Chen, PJ
    Shapiro, AJ
    McMichael, RD
    Mallett, JJ
    Moffat, TP
    Stiles, MD
    Svedberg, EB
    JOURNAL OF APPLIED PHYSICS, 2004, 95 (11) : 7554 - 7559
  • [7] A method for ballistic measurements of magnetic moments
    von Klitzing, KH
    PHYSIKALISCHE ZEITSCHRIFT, 1944, 45 : 326 - 327
  • [8] Ballistic measurements with electrometer tube circuits
    Varian, RH
    Clark, JC
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1935, 6 (09): : 284 - 284
  • [9] STRATEGIC BALLISTIC MISSILE GUIDANCE - STORY OF EVER GREATER ACCURACY
    HOAG, DG
    ASTRONAUTICS & AERONAUTICS, 1978, 16 (05): : 28 - 39
  • [10] Sensitivity analyzing of rocket ballistic parameters based on sensitivity function theory
    Wang, Xin
    Zhang, Fengge
    Ya, Jun
    Wang, Yuxin
    ICIEA 2008: 3RD IEEE CONFERENCE ON INDUSTRIAL ELECTRONICS AND APPLICATIONS, PROCEEDINGS, VOLS 1-3, 2008, : 1207 - +
12345