EVALUATION OF THE ITEE EXAM QUESTIONS

被引：0
|
作者：
KAMIJO, F
NAKAYASHIKI, M
机构：
来源：
IFIP TRANSACTIONS A-COMPUTER SCIENCE AND TECHNOLOGY | 1992年 / 17卷
关键词：
TESTING; CERTIFICATION; AND LICENSING; OCCUPATIONS; COMPUTER AND INFORMATION SCIENCE EDUCATION;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
The subject of this paper is a quantitative analysis of the ITEE exam questions. The frequency distribution of correct answers with respect to points achieved, the ratio of exam success rate to correct answers, the reliability of each question, and the selection ability analyses for a good question and a poor question are the major items analysed. The results are combined with qualitative analyses of question subjects. The results of this analysis will be effective for establishing a revised exam design policy in the future.
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页码：179 / 186
页数：8
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