BACK-FACE STRAIN COMPLIANCE AND ELECTRICAL-POTENTIAL CRACK LENGTH CALIBRATIONS FOR THE DISK-SHAPED COMPACT-TENSION DC(T) SPECIMEN

被引：27

作者：

GILBERT, CJ ^{[1
]}

MCNANEY, JM ^{[1
]}

DAUSKARDT, RH ^{[1
]}

RITCHIE, RO ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY,DEPT MAT SCI & MINERAL ENGN,BERKELEY,CA 94720

来源：

JOURNAL OF TESTING AND EVALUATION | 1994年 / 22卷 / 02期

关键词：

BACK-FACE STRAIN COMPLIANCE; ELECTRICAL-POTENTIAL CALIBRATION; DISK-SHAPED COMPACT-TENSION DC(T) SPECIMEN;

D O I：

10.1520/JTE12644J

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Back-face strain compliance and electrical-potential crack length calibrations have been experimentally determined for the disk-shaped compact-tension DC(T) specimen. Finite-element modeling was used to ascertain the back-face strain distribution at several crack lengths to determine the significance of inconsistent gage placement. The numerical solutions demonstrated good agreement with experiment, especially at smaller crack lengths when the back-face strain gradients are minimal. It is concluded that precise gage placement is only critical when the crack tip closely approaches the back of the test specimen.

引用

页码：117 / 120

页数：4