METHOD FOR DETERMINING POLYTYPIC MODIFICATIONS OF SILICON-CARBIDE FROM KIKUCHI-ELECTRON DIFFRACTION PATTERNS

被引:0
|
作者
ZHUKOVA, LA [1 ]
EVSTIGNEEV, AM [1 ]
PROKOFEVA, NK [1 ]
SHASHKOV, YM [1 ]
GRAN, YM [1 ]
机构
[1] MOSCOW RARE MET IND RES & DESIGN INST,MOSCOW,USSR
来源
KRISTALLOGRAFIYA | 1976年 / 21卷 / 04期
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D O I
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中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
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页码:807 / &
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