NONINTERFEROMETRIC MEASUREMENT OF THE X-RAY REFRACTIVE-INDEX OF BERYLLIUM

被引：12
|
作者：
DEUTSCH, M [1 ]
HART, M [1 ]
机构：
[1] UNIV LONDON KINGS COLL,WHEATSTONE LAB,LONDON WC2R 2LS,ENGLAND
来源：
PHYSICAL REVIEW B | 1984年 / 30卷 / 02期
关键词：
D O I：
10.1103/PhysRevB.30.643
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：643 / 646
页数：4
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