USE OF A VIDICON CAMERA FOR MEASUREMENT OF LEED BEAM INTENSITIES BY PHOTOGRAPHIC METHOD

被引：28

作者：

FROST, DC ^{[1
]}

MITCHELL, KAR ^{[1
]}

SHEPHERD, FR ^{[1
]}

WATSON, PR ^{[1
]}

机构：

[1] UNIV BRITISH COLUMBIA,DEPT CHEM,VANCOUVER V6T 1W5,BRITISH COLUMBI,CANADA

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1976年 / 13卷 / 06期

关键词：

D O I：

10.1116/1.569068

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1196 / 1198

页数：3

共 11 条

[1] FAST LEED-INTENSITY MEASUREMENTS WITH A COMPUTER-CONTROLLED TELEVISION SYSTEM [J].

HEILMANN, P ;

LANG, E ;

HEINZ, K ;

MULLER, K .

APPLIED PHYSICS, 1976, 9 (03) :247-251

[2]

HORDER A., 1971, MANUAL PHOTOGRAPHY

[3]

JONA F, 1975, DISCUSS FARADAY SOC, V60, P210

[4] DECOMPOSITION OF CARBON-MONOXIDE ON A (110) NICKEL SURFACE [J].

MADDEN, HH ;

ERTL, G .

SURFACE SCIENCE, 1973, 35 (01) :211-226

[5] DETERMINATION OF STRUCTURE OF ORDERED ADSORBED LAYERS BY ANALYSIS OF LEED SPECTRA [J].

MARCUS, PM ;

DEMUTH, JE ;

JEPSEN, DW .

SURFACE SCIENCE, 1975, 53 (DEC) :501-522

[6] LEED STUDY OF OXYGEN ADSORPTION ON COPPER (100) AND (111) SURFACES [J].

MCDONNELL, L ;

WOODRUFF, DP .

SURFACE SCIENCE, 1974, 46 (02) :505-536

[7] NEW RAPID AND ACCURATE METHOD TO MEASURE LOW-ENERGY-ELECTRON-DIFFRACTION BEAM INTENSITIES - INTENSITIES FROM CLEAN PT (111) CRYSTAL-FACE [J].

STAIR, PC ;

KAMINSKA, TJ ;

KESMODEL, LL ;

SOMORJAI, GA .

PHYSICAL REVIEW B, 1975, 11 (02) :623-629

[8]

STROZIER JA, 1975, SURFACE PHYSICS MATE, V1

[9] CHEMISORPTION BOND LENGTHS OF CHALCOGEN OVERLAYERS AT A LOW COVERAGE BY CONVERGENT PERTURBATION METHODS [J].

VANHOVE, M ;

TONG, SY .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01) :230-233

[10] SYMMETRY IN LEED AND REPRODUCIBILITY OF DATA [J].

WOODRUFF, DP ;

MCDONNELL, L .

SURFACE SCIENCE, 1973, 40 (01) :200-203

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