IMPROVEMENT IN HIGH-RESOLUTION IMAGE QUALITY OF RADIATION-SENSITIVE SPECIMENS ACHIEVED WITH REDUCED SPOT SIZE OF THE ELECTRON-BEAM

被引：67

作者：

DOWNING, KH ^{[1
]}

GLAESER, RM ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB,DEPT BIOPHYS & MED PHYS,BERKELEY,CA 94720

来源：

ULTRAMICROSCOPY | 1986年 / 20卷 / 03期

关键词：

D O I：

10.1016/0304-3991(86)90191-9

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：269 / 278

页数：10

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