Using microwave multimeters to measure the parameters of dielectrics

被引：0
|
作者：
Mekhannikov, AI
Perepelkin, VA
机构：
来源：
MEASUREMENT TECHNIQUES USSR | 1995年 / 38卷 / 06期
关键词：
D O I：
10.1007/BF00991119
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A method of nondestructive measurement of the complex dielectric constant using a microwave multimeter and probe antennas is described.
引用
收藏
页码：678 / 682
页数：5
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