HIGH-RESOLUTION MICROWAVE ZEEMAN SPECTROMETER

被引：1
|
作者：
BHATTACHARYYA, PK [1 ]
TAFT, H [1 ]
SMITH, N [1 ]
DAILEY, BP [1 ]
机构：
[1] COLUMBIA UNIV,DEPT CHEM,NEW YORK,NY 10027
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1975年 / 46卷 / 05期
关键词：
D O I：
10.1063/1.1134273
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：608 / 612
页数：5
相关论文
共 50 条
  • [1] HIGH-RESOLUTION MICROWAVE ZEEMAN SPECTROMETER
    HOISINGTON, RWR
    KELLNER, C
    PENTZ, MJ
    NATURE, 1956, 178 (4542) : 1111 - 1112
  • [2] MOLECULAR MICROWAVE OSCILLATOR AND HIGH-RESOLUTION SPECTROMETER
    GORDON, JP
    WANG, TC
    ZEIGER, HJ
    TOWNES, CH
    SCIENCE, 1954, 120 (3124) : 780 - 780
  • [3] HIGH-RESOLUTION SPECTROMETER USING A LASER WITH FREQUENCY OBTAINED BY ZEEMAN EFFECT
    BRUNET, H
    REVUE DE PHYSIQUE APPLIQUEE, 1967, 2 (03): : 191 - +
  • [4] A HIGH-RESOLUTION CHIRP TRANSFORM SPECTROMETER FOR MICROWAVE MEASUREMENTS
    HARTOGH, P
    HARTMANN, GK
    MEASUREMENT SCIENCE AND TECHNOLOGY, 1990, 1 (07) : 592 - 595
  • [5] HIGH-RESOLUTION ZEEMAN POLARIMETRY
    BORRA, EF
    LANDSTRE.JD
    VAUGHAN, AH
    ASTROPHYSICAL JOURNAL, 1973, 185 (03): : L145 - L147
  • [6] HIGH-RESOLUTION CRYSTAL SPECTROMETER
    BITTER, M
    VONGOELER, S
    GOLDMAN, M
    HILL, K
    HORTON, RW
    SAUTHOFF, N
    STODIEK, W
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (05): : 698 - 698
  • [7] HIGH-RESOLUTION RAMAN SPECTROMETER
    NECHAEV, SY
    PONOMAREV, YN
    KVANTOVAYA ELEKTRONIKA, 1975, 2 (07): : 1400 - 1402
  • [8] High-Resolution Terahertz Spectrometer
    Klatt, Gregor
    Gebs, Raphael
    Schaefer, Hanjo
    Nagel, Michael
    Janke, Christof
    Bartels, Albrecht
    Dekorsy, Thomas
    IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2011, 17 (01) : 159 - 168
  • [9] HIGH-RESOLUTION NMR SPECTROMETER
    SAMITOV, YY
    AGANOV, AV
    VINOGRADOV, LI
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR, 1967, (06): : 1359 - +
  • [10] HIGH-RESOLUTION GRATING SPECTROMETER
    PORTO, SPS
    SZULE, A
    GUIMARAES, WON
    NETO, JRP
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (09) : 921 - 922
12345